Sources

Silicon semiconductors are currently fabricated using an optical lithography process

IC Line features (circuit connecting line width) are limited by light wavelength

  • 130nm today & using 248nm light
  • 90nm planned by 2004, using 193nm light
  • 65nm planned for 2007 using 157nm light – technology is challenging

A Next Generation Lithography (NGL) process for silicon semiconductor fabrication is needed to reach industry goals of 45nm & 32nm (and possibly even for 65nm)

  • X-Ray Lithography (XRL) is a candidate
AASC has developed a compact, modular x-ray source that could displace deep UV lasers and EUV sources

For more information, contact Mahadevan Krishnan @ 510-483-4156 x202 or general@aasc.net